1. Руководства и программное обеспечение
  2. Варианты договора по сопровождению и поддержке
  3. Дополнительное оборудование
  4. Events and Training

Руководства и программное обеспечение


Варианты договора по сопровождению и поддержке

Solutions to maximize the return on your investment

To assure that your instrument remains in top condition and performs on
the highest level, PANalytical offers a wide range of services. Our Expertise
and support services assure an optimal functioning of your instrument.

Support

Service for a lifetime
• Phone and remote support
• Preventive maintenance and checkups
• Flexible Customer Care Agreements
• Performance certificates
• Hardware and software upgrades
• Local and global support

Expertise

Adding value to your processes
• Sample preparation development/optimization
• Analytical methodologies
• Turnkey solutions for XRD
• Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
• Automation of lab processes
• Consultancy services

Training and education

• Training on-site or at our competence centers
• Broad range of basic and advanced courses on products, applications and software

Analytical services and calibration materials

• Expert (XRF) analyses services
• Oxides and trace analysis
• Customized calibration materials 

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Дополнительное оборудование

X'Pert³ Powder

Detectors

X'Celerator

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The world’s first 1D silicon strip detector for laboratory X-rays

As the world’s first silicon-based position-sensitive 1D detector for XRD, the X’Celerator is the result of the pioneering development from Malvern Panalytical. With the R&D 100 Award-winning X’Celerator detector you can perform XRD measurements up to 100 times faster than with a traditional point detector, without compromising data quality. With no need for cooling water, liquid nitrogen flow, counting gas or time-consuming calibrations, it is a cost-effective solution.

The X’Celerator is designed exclusively for Malvern Panalytical’s diffractometers for applications in research and industry.

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PIXcel1D

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Medipix technology as a dedicated strip detector

With the PIXcel1D detector you have a dedicated strip detector for 0D and 1D applications. You can measure up to 255 times faster than with a traditional point detector, without compromising data quality. With no need for cooling water, liquid nitrogen flow, counting gas or time-consuming calibrations it is a cost-effective solution.

With an unrivalled resolution and dynamic range, the PIXcel1D can be used with all of our diffractometers.

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Non-Ambient Chambers

BTS 150/500 – benchtop heating stages

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Cost-effective attachment for non-ambient XRD

Anton Paar BTS 150 and BTS 500 benchtop heating stages are compact and cost-effective solutions for basic non-ambient X-ray diffraction experiments in reflection geometry. BTS 150 is equipped with a Peltier heating element enabling a temperature range from – 10 ºC to 150 ºC. The resistance heater of BTS 500 allows the heating of a sample from ambient temperature up to 500 ºC. Both heating stages can be used with an air, vacuum or inert gas atmosphere. A thermocouple is placed close to the sample for accurate temperature measurement and control. An optional beam knife can be used to minimize low- angle background.

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Chimera – cooling and heater chamber for powder diffraction

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Closed-cycle He cryostat for XRD at low to medium-high temperature

The Chimera chamber is a new non-ambient attachment from Oxford Cryosystems and essentially a smaller version of the Phenix Cryostat. It incorporates a single stage Gifford McMahon cooler (as opposed to the two-stage cooler of the Phenix) to enable measurements at temperatures from -203 ºC (70 K) to 252 ºC (525 K) without liquid nitrogen. Chimera offers excellent temperature stability of 0.1 K and variable ramp rates, (1 – 360 K/hour). It takes only 35 minutes to cool down from room temperature to 70 K. Thanks to the design there is virtually no consumption of helium. Sample preparation and exchange are quick and easy.

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CHC plus+ – cryo and humidity chamber

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Unique solution for XRD at controlled temperature and humidity

The Anton Paar CHC plus+ chamber is designed for in situ powder X-ray diffraction measurements in reflection geometry and allows performing both high- and low-temperature experiments and experiments with controlled temperature and humidity conditions. The entire temperature range accessible with this chamber is from – 180 ºC to 400 ºC. If cooling below -10 ºC is not required, compressed air cooling can be used instead of liquid nitrogen cooling. The relative humidity can be changed from 5 to 95 %rH at temperatures from 10 to 80 ºC. Optionally a beam knife can be placed above the sample for improved low-angle background. 

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Cryostream Plus compact

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Unique device for in situ experiments in capillary geometry

Cryostream Plus Compact from Oxford Cryosystems enables XRD experiments in transmission geometry at temperatures from 227°C (500 K) down to -193 °C (80 K).

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DCS 350 – domed cooling stage

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Unique compact attachment for thin film analysis at low temperature

Anton Paar DCS 350 is a unique compact high-temperature device allowing tilt and rotation of the sample with respect to the X-ray beam for advanced thin film applications and residual stress and texture measurements. The optimized design of the heater/cooling plate guarantees high temperature uniformity along the sample and accurate temperature measurement and control in the entire temperature range, from -100 to 350 ºC. Full rotation of the attachment is possible only above 0 ºC, as below this temperature the hoses supplying liquid nitrogen to the stage for cooling are freezing and hence restricting sample rotation. The X-ray- transparent half-circle dome over the sample enables a large field of view.

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DHS 1100 – domed hot stage

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Studying thin films and solids at high-temperature conditions

Anton Paar DHS 1100 is a unique compact high-temperature device allowing tilt and rotation of the sample with respect to the X-ray beam for advanced thin film applications. The optimized heater design guarantees high temperature uniformity and accurate temperature measurement and control. The X-ray-transparent half-circle dome enables a large field of view when working with 2D detectors. For easy handling of air-sensitive samples a gas flow ring enabling a flow of inert gas is placed around the sample insert port.

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HPC 900 - high pressure chamber

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In situ XRD at high pressure and high temperature conditions

Anton Paar HPC 900 is a furnace-type heater optimized for in situ powder X-ray diffraction measurements (reflection geometry, Mo or Ag radiation) on powder and solid samples with gas atmospheres in the pressure range from 1 to 100 bars. It was designed to work with hydrogen, but other gases can also be used (please see chamber leaflet for details). A double-wall chamber design consisting of an inner pressure core and an outer safety shell is flushed with N2 gas to prevent accumulation of dangerous gas mixtures. Due to the environmental heating to 900 ºC high temperature uniformity is guaranteed over the entire sample volume. The thermocouple is placed right underneath the sample for accurate temperature measurement and control. For an easy handling of air-sensitive samples a gas flow ring enabling a flow of inert gas is placed around the sample insert port.

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HTK 1200N – oven heater

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Versatile high-temperature oven chamber

Anton Paar HTK 1200N is designed for powder X-ray diffraction in reflection and transmission geometries with environmental heating of the sample up to 1200 ºC in air, inert atmosphere or vacuum. Thanks to the heater geometry there is virtually no restriction on sample thickness, therefore, along with organic or inorganic powders, high-temperature behavior of bulk samples can also be studied with this chamber. The thermocouple is placed right underneath the sample for accurate temperature measurement and control. Optional oscillation of the sample table helps to improve particle statistics for powder XRD in reflection geometry. An optional capillary spinner attachment enables measurements in transmission geometry for highly air-sensitive materials or samples with a strong tendency to preferred orientations. Sample preparation and sample exchange is very easy and straightforward.

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HTK 16N – high-temperature chamber

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For fast heating to 1600 ºC

Anton Paar HTK 16N is a strip heater chamber designed for in situ powder X-ray diffraction in reflection geometry at temperatures up to 1600 ºC in vacuum, air or inert atmosphere. Depending on the experimental requirements, various types of heating strips (Pt, Ta, graphite; others on request) can be mounted inside the chamber. Due to the direct sample heating the heat-up rate with a Pt or Ta strip can be as fast as 400 ºC/min. The design of the chamber is optimized for a minimum temperature gradient along the heating strip and for maximum position stability of the sample. Two thermocouples are available for accurate temperature measurement and control. Optionally a beam knife can be placed above the sample for improved background at low angles. The HTK 16N is suitable for XRD studies of both organic and inorganic materials.

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HTK 2000N – high-temperature chamber

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For XRD at extremely high temperatures

Anton Paar HTK 2000N is a strip heater chamber designed for powder X-ray diffraction in reflection geometry at extremely high temperatures up to 2300 ºC (tungsten strip) in vacuum, air or inert atmosphere. Depending on the experimental requirements, various types of heating strips (Pt, W, Ta; others on request) can be mounted inside the chamber. Due to the direct sample heating the heat-up rate can be as fast as 500 ºC/min (with W strip). The design of the chamber is optimized for a minimum temperature gradient along the heating strip and for maximum position stability of the sample.

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MHC-trans – multi-sample humidity chamber

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Optimized solution for XRD at controlled temperature and humidity

The Anton Paar MHC-trans chamber is a dedicated chamber for in situ powder X-ray diffraction measurements at controlled temperature and humidity conditions. The chamber is designed for transmission geometry (foils) and has a built-in sample changer with 8 sample positions for high throughput applications. It has an environmental heater enabling temperatures from -10 to 150 ºC in dry atmosphere (dry air or nitrogen gas). The relative humidity can be changed from 5 to 95 %rH at temperatures from 10 to 80 ºC. The thermocouple and humidity sensor are in the direct vicinity of the sample for accurate measurement and control of both temperature and relative humidity. The chamber is equipped with a beam stop for an improved low-angle background.

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PheniX – low temperature cryostat

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Unique device for experiments at extremely low temperatures

Oxford Cryosystems PheniX is a unique solution for X-ray diffraction at extremely low temperatures. It is a compact closed-cycle helium cryostat enabling a temperature range from 25 °C (298 K) down to - 261 °C (12 K) with a temperature uniformity across the sample of 0.1 degree. It takes only 40 minutes to cool down to 20 K and an additional 20 minutes to reach a temperature of 12 K. Thanks to the design there is virtually no consumption of helium. Sample preparation and exchange is quick and easy.

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TTK 600 – low temperature chamber

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Versatile chamber for work at low to medium-high temperatures

The Anton Paar TTK 600 chamber is the successor of the TTK 450 low-temperature chamber. This new TTK 600 low-temperature chamber is equipped with an improved heating/cooling mechanism, extending the temperature range from -190 ºC to +600 ºC. TTK 600 enables in situ powder XRD measurements in both reflection and transmission and can be used with air, inert atmosphere or vacuum. If cooling below -10 ºC is not required, compressed air cooling can be used instead of liquid nitrogen cooling. Thermocouple is placed right underneath the sample for accurate temperature measure and control. Optional beam knife or beam stop can be placed inside the chamber for the improved low angle background in reflection or transmission, respectively.

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XRK 900 – reactor chamber

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Unique solution for in situ XRD at varying gas atmospheres

Anton Paar XRK 900 is a furnace-type heater optimized for in situ powder X-ray diffraction measurements (reflection geometry) at various gas atmospheres in the pressure range from 1 mbar to 10 bars. Due to environmental heating to 900 ºC, high temperature uniformity is guaranteed over the entire sample volume. The thermocouple is placed right underneath the sample for accurate temperature measurement and control. Optional oscillation of the sample table helps to improve the particle statistics for powder XRD in reflection geometry. Sample holders allowing for gas flow through the sample ensure a maximum reaction surface. A special sample holder unit with an additional electrical feed through for battery research at temperatures to 260 ºC is available.

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