The long and successful history of Malvern Panalytical's Materials Research Diffractometers (MRD) continues with the generation of X’Pert³ MRD XL. The improved performance and reliability of the new platform have added more analytical capability and power for X-ray scattering studies.
X'Pert³ MRD XL
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User manuals
X'Pert³ MRD XL Pre-installation manual (English)
Version number: 6
Stress (Plus) Quick Start Guide
Version number: 7
X'Pert Industry Quick Start Guide
Version number: 2
X'Pert Quantify Quick Start Guide
Version number: 4
X'Pert³ MRD XL User Guide (Other Languages)
Version number: 4
HighScore (Plus) Quick Start Guide
Version number: 3
Data Viewer Quick Start Guide ED10
Version number: 10
Data Viewer Quick Start Guide ED9
Version number: 9
X'Pert Operator Interface Quick Start Guide
Version number: 4
Automatic Processing Program Quick Start Guide
Version number: 7
X'Pert3 MRD XL User Guide
Version number: 4
Software downloads
Please contact support for the latest software version.
Accessories
Detectors
PIXcel3D
The first detector to bring 0D-1D-2D and 3D data to your diffractometer
The PIXcel3D is a unique 2D solid-state hybrid pixel detector. Each pixel is 55 microns x 55 microns and the detector array is 256 x 256 pixels. The detector, now based on Medipix3 technology, brings unrivalled signal to noise with its point spread function of one pixel and multiple energy discrimination levels.
General
X’Pert³ MRD XL Cleanroom Package
More measuring environments, minimal extra investment
The X’Pert3 MRD XL Cleanroom Package comprises smart solutions, including a fan filter unit, for the MRD XL that can be retrofitted to your existing instrument or supplied with a new one.
By filtering the air around your semiconductor wafer sample, the MRD XL Cleanroom Package helps you avoid contamination when analyzing them. In turn, this enables you to measure in a wider range of environments without having to invest in a new instrument.
X’Pert³ MRD XL Automation
A fully automated solution for complex layer stack metrology
As an additional software solution for our X’Pert3 MRD XL tool, automation can be integrated into your existing instrument to provide SECS/GEM compliant host control.
With these new capabilities, the MRD XL system can now play out its modularity and flexibility in a host controlled fab environment. This enables ensuring a contamination-free research or production environment.
Service and Support
Support services
- Phone and remote support
- Preventive maintenance and checkups
- Flexible Customer Care Agreements
- Performance certificates
- Hardware and software upgrades
- Local and global support
Expertise
- Turnkey solutions for elemental and structural semiconductor metrology
- Automation and consultancy
- Training and education