Process and quality control in the iron and steel industry are driven by rapid and accurate elemental analysis to ensure consistency of the end product. X-ray fluorescence (XRF) is a proven technique to determine with high accuracy the elemental composition of a wide range of materials at different stages of the manufacturing process. Traditionally X-ray fluorescence spectrometers are based on two different techniques: energy dispersive (ED) and wavelength dispersive (WD) spectrometry. Each technique presents unique advantages for the characterization of materials during various production stages. With the results overall process optimization, ease of operation, low cost of ownership and consequently quicker return on investment can be achieved.

In this webinar, we explore key solutions using XRF spectrometers, which are able to satisfy the demanding analytical requirements of various applications, from raw materials to low- and high-alloy steels. A comparative study will be shown; additionally key benefits of combining ED and WD – the unique SumXcore technology - in one instrument will be illustrated. We will introduce the Zetium spectrometer and demonstrate how our new approach revolutionizes XRF analysis, resulting in significantly improved analytical capabilities and reduction of the total cost of ownership. Finally we will present the significant customer benefits for typical steel applications.
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