Malvern Panalytical has >750 application notes and we also have many published papers showing how our technologies are used for a large range of applications. Here we have cataloged our application notes according to the themes of University Departments. This gives you the opportunity to have an overview of what has been produced in subjects close to yours. You may be quite knowledgeable in one analytical method and want to know how other analysis types are used in your field of research. You may be starting a new field of research and want to know what can help you gain vital knowledge. Take some time to look around! If you don’t find what you’re looking for, contact us. We may be able to find information for you that is not yet published.
Analysis methods are indicated by abbreviations. There is a table at the bottom of each page explaining the method and its abbreviation.
Click on a department heading to find relevant application notes!
If you don’t find what you are looking for. Don’t be afraid to Contact Us.
EXPLORE
Agriculture and food sciences
Biological and medical sciences
Chemistry and applied chemistry
Civil engineering, architecture, and archaeology
Electronic engineering and semiconductor materials
Energy, fuel, and automotive engineering
Environmental and climate science
Geological sciences, minerals, and mining engineering
Materials science and engineering
Pharmaceutical sciences
Physics and applied physics
Abbreviations explained
Our products and technologies are described on the Products pages. Below you can find a quick reference to the properties measured by our instruments, together with the measurement name and its abbreviation. Click on each method to find out more about it!
Abbreviation | Method Name | Instrument(s) | Measured Property |
|---|---|---|---|
DLS | Dynamic Light Scattering | Zetasizer | Molecular size, hydrodynamic radius RH, particle size, size distribution, stability, concentration, agglomeration |
ELS | Electrophoretic Light Scattering | Zetasizer | Zeta potential, particle charge, suspension stability, protein mobility |
ITC | Iso-thermal Titration Calorimetry | MicroCal ITC | Binding affinity, thermodynamics of molecular reactions in solution |
DSC | Differential Scanning Calorimetry | Microcal DSC | Denaturing (unfolding) of large molecules, stability of macromolecules |
GCI | Grating-Coupled Interferometry | Creoptix WAVEsystem | Real-time binding kinetics and binding affinity, label free with fluidics |
IMG | Automated Image Analysis
| Morphologi 4
| Imaging of particles, automated shape and size measurement
|
MDRS | Morphologically-Directed Raman Spectroscopy | Morphologi 4-ID | Imaging of particles, automated shape and size measurement, chemical identification and contaminant detection |
LD | Mastersizer Spraytec Insitec Parsum | Particle size, size distribution | |
NTA | NanoSight | Particle size, size distribution, and concentration | |
SEC or GPC | Size exclusion chromatography / Gel permeation chromatography | OMNISEC | Molecular size, molecular weight, oligomeric state, polymer or protein size and molecular structure |
SPE | Le Neo LeDoser Eagon 2 The OxAdvanced M4 rFusion | Fused Bead Sample preparation for XRF, Peroxide solution preparations for ICP, Flux weighing for beadmaking | |
UV/Vis/NIR/ SWIR | Ultra-violet / visible / near infra-red / short wave infra-red spectrometry | LabSpec FieldSpec TerraSpec QualitySpec | Material identification and analysis, moisture, mineral, carbon content. Ground truthing for airborne and satellite spectroscopic techniques. |
PFTNA | Pulsed Fast Thermal Neutron Activation | CNA | In-line elemental analysis |
XRD-C | Aeris Empyrean | Molecular crystal structure refinement, crystalline phase identification and quantification, crystalline to amorphous ratio, crystallite size analysis | |
XRD-M | Empyrean X’Pert3 MRD(XL) | Residual stress, texture | |
XRD-CT | Empyrean | 3D imaging of solids, porosity, and density | |
SAXS | Empyrean | Nanoparticles, size, shape and structure | |
GISAXS | Empyrean | Nanostructured thin films and surfaces | |
HR-XRD | Empyrean X’Pert3 MRD(XL) | Thin-films and epitaxial multilayers, composition, strain, thickness, quality | |
XRR | Empyrean X’Pert3 MRD(XL) | Thin films and surfaces, film thickness, surface and interface roughness | |
XRF | Epsilon Zetium Axios FAST 2830 ZT | Elemental composition, elemental concentration, trace elements, contaminant detection |