Research themes

You’ll be amazed where our instruments are used

Download brochure

Malvern Panalytical has >750 application notes and we also have many published papers showing how our technologies are used for a large range of applications.  Here we have cataloged our application notes according to the themes of University Departments. This gives you the opportunity to have an overview of what has been produced in subjects close to yours. You may be quite knowledgeable in one analytical method and want to know how other analysis types are used in your field of research. You may be starting a new field of research and want to know what can help you gain vital knowledge. Take some time to look around! If you don’t find what you’re looking for, contact us. We may be able to find information for you that is not yet published. 

Analysis methods are indicated by abbreviations. There is a table at the bottom of each page explaining the method and its abbreviation.

Click on a department heading to find relevant application notes! 

If you don’t find what you are looking for. Don’t be afraid to Contact Us.

Abbreviations explained

Our products and technologies are described on the Products pages. Below you can find a quick reference to the properties measured by our instruments, together with the measurement name and its abbreviation. Click on each method to find out more about it! 

Abbreviation

Method Name

Instrument(s)

Measured Property

DLS

Dynamic Light Scattering

Zetasizer

Molecular size, hydrodynamic radius RH,  particle size, size distribution, stability, concentration, agglomeration

ELS

Electrophoretic Light Scattering

Zetasizer

Zeta potential, particle charge, suspension stability, protein mobility

ITC

Iso-thermal Titration Calorimetry

MicroCal  ITC

Binding affinity, thermodynamics of molecular reactions in solution

DSC

Differential Scanning Calorimetry

Microcal DSC

Denaturing (unfolding) of large molecules, stability of macromolecules

GCI

Grating-Coupled Interferometry

Creoptix WAVEsystem

Real-time binding kinetics and binding affinity, label free with fluidics

IMG

Automated Image Analysis

Morphologi 4

Imaging of particles, automated shape and size measurement

MDRS

Morphologically-Directed Raman Spectroscopy

Morphologi 4-ID

Imaging of particles, automated shape and size measurement, chemical identification and contaminant detection

LD

Laser Diffraction

Mastersizer

Spraytec

Insitec

Parsum

Particle size, size distribution

NTA

Nanoparticle Tracking Analysis

NanoSight

Particle size, size distribution, and concentration

SEC  or  GPC

Size exclusion chromatography /

Gel permeation chromatography

OMNISEC

Molecular size, molecular weight, oligomeric state, polymer or protein size and molecular structure

SPE

Sample preparation by fusion

Le Neo

LeDoser

Eagon 2

The OxAdvanced

M4

rFusion

Fused Bead Sample preparation for XRF, Peroxide solution preparations for ICP, Flux weighing for beadmaking

UV/Vis/NIR/ SWIR

Ultra-violet / visible / near infra-red / short wave infra-red spectrometry

LabSpec

FieldSpec

TerraSpec

QualitySpec

Material identification and analysis, moisture, mineral, carbon content. Ground truthing for airborne and satellite spectroscopic techniques.

PFTNA

Pulsed Fast Thermal Neutron Activation

CNA

In-line elemental analysis

XRD-C

X-ray Diffraction  (crystallography)

Aeris

Empyrean

Molecular crystal structure refinement,

crystalline phase identification and quantification, crystalline to amorphous ratio, crystallite size analysis

XRD-M

X-ray Diffraction  (microstructure)

Empyrean

X’Pert3 MRD(XL)

Residual stress, texture

XRD-CT

X-ray absorption  imaging by computed tomography

Empyrean

3D imaging of solids, porosity, and density

SAXS

Small-Angle X-Ray Scattering

Empyrean

Nanoparticles, size, shape and structure

GISAXS

Glancing Incidence Small-Angle X-Ray Scattering

Empyrean

Nanostructured thin films and surfaces

HR-XRD

High-Resolution X-Ray Diffraction

Empyrean

X’Pert3 MRD(XL)

Thin-films and epitaxial multilayers, composition, strain, thickness, quality

XRR

X-Ray Reflectometry

Empyrean

X’Pert3 MRD(XL)

Thin films and surfaces, film thickness, surface and interface roughness

XRF

X-Ray Fluorescence

Epsilon

Zetium

Axios FAST

2830 ZT

Elemental composition, elemental concentration, trace elements, contaminant detection