Malvern Panalytical has a range of unique, market leading, products that are protected by the following patent and patent applications
Mastersizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP1167946B1 (GB, FR, DE60135521D1) | Sample handling system | Hydro MV, Hydro LV, Hydro EV |
| GB2364774B
US6800251B2 | Sample handling system for use in a particle characterisation apparatus | Hydro MV, Hydro LV |
| GB2494735B | Apparatus for measuring particle-size distribution by light scattering | MS3000, MS3000E |
| CN104067105B
EP2756283B1 (GB, FR, DE602012015707) US9869625B2 JP6154812B | Apparatus and method for measuring particle-size distribution by light scattering | MS3000, MS3000E |
| US20150138551A1
GB2494734B | Apparatus and method for measuring particle-size distribution by light scattering | MS3000, MS3000E |
Zetasizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP1154266B1 (FR, DE60137884D1)
JP04727064B2 US7217350B2 GB2361772B | Mobility and Effects Arising from Surface Charge | Zetasizer Nano ZS, Nano Z, Nano ZS90, Nano ZSP, Helix |
| EP2467701A1
CN102575984B US9279765B2 JP5669843B2 US10317339B2 | Dynamic Light Scattering Based Microrheology of Complex Fluids with Improved Single-Scattering Mode Detection | Zetasizer Nano ZSP, Helix |
| CN103608671B
CN105891304B EP2721399B1 (BE, CH+LI, DK, FR, GB, NL, DE602012031338, IT502017000050268) JP06023184B2 US9829525B2 US10274528B2 | Surface Charge Measurement | Zeta Plate Cell Accessory |
| US8702942B2
CN103339500B EP2652490B1 (GB, FR, DE602011046775) JP06006231B2 JP06453285B2 US20170269030A1 | Laser Doppler Electrophoresis Using a Diffusion Barrier | Zetasizer Nano ZS, Nano S, Nano ZS90, S90, Nano ZSP |
| EP2742337B1 (GB, FR, DE602012018122)
US9816922B2 | Dual mode characterization of particulates | Zetasizer Helix |
Insitec
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7418881B2
EP1592957B1 (GB) | Dilution system and method | Insitec (some products) |
| US7871194B2
EP1869429A2 | Dilution system and method | Insitec (some products) |
| EP2640499B1 (GB) | In-line disperser and powder mixing method | Insitec dry |
Kinexus
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US6714879B2
EP1219948B2 (GB, FR, DE60150291) | Closed Loop Rheometer | Kinexus Pro, Ultra, DSR; |
| CN102112860B
EP2329248B1 (GB, FR, DE602009035666) JP5721626B2 US9389159B2 | Expert System Based Rheology | Kinexus product range |
| US8225644B2 | Rheometer with modular environmental control system | Kinexus Pro, Ultra, DSR |
| EP2307873B2 (GB, FR, DE602009051371)
CN102112861B JP05314761B2 US9958368B2 | Rheometer Control System | Kinexus product range |
Morphologi
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| EP2106536B1 (GB, FR, DE602008039489)
US8111395B2 US8564774B2 | Spectrometric Investigation of hetrogeneity | Morphologi G3-ID |
| GB2522735B
JP6560849B2 | Method and Apparatus for Powder Dispersion | Morphologi G3-ID, Morphologi G3 |
Viscosizer
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7262847B2
CN1688878B EP1530716B1 (BE, CH+LI, GB, FR, IE, DE60309476) JP04411457B2 | Optical assembly and method for detection of light transmission | Viscosizer TD |
| CN103270403B
EP2625503A1 | Viscosity measurement apparatus and method | Viscosizer TD |
| US2018067901A1
JP2018511129A EP3274864A1 CN107430593A | Multi-Component Model Parameterisation | Viscosizer TD |
| US8456633B2 | Spectrometrics Process Monitoring | Viscosizer TD |
Hydro Sight
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8456633B2 | Spectrometric Process Monitoring | Hydro Sight |
| CN104704343B
EP2864760A2 US20150338334A1 | Heterogeneous Fluid Sample Characterisation | Hydro Sight |
Archimedes
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8087284B2
EP2080006B2 (GB, FR, DE602007049080) US9027388B2 | Method and Apparatus for Measuring Particle Characterisation Through Mass Detection | Archimedes |
NanoSight
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US7751053B2
JP04002577B2 EP1499871B1 (FR, DE60335872) GB2388189B US7399600B2 | Optical Detection for Analysis of Particles | NanoSight NS300
NanoSight NS500 NanoSight LM10 |
MicroCal ITC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| CN101855541B
EP2208057A1 JP05542678B2 US8449175C1 US8827549C1 | Isothermal Titration Microcalorimeter apparatus and method of use | MicroCal ITC Range |
| CN102232184B
EP2352993B1 (CH+LI, GB, FR, DE602009044685) JP5476394B2 US9103782B2 US9404876B2 US10036715B2 US10254239B2 EP3144666B1 (CH+LI, GB, FR, DE602009059932) | Automatic Isothermal Titration Microcalorimeter Apparatus and method of Use | MicroCal ITC Range |
MicroCal DSC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8635045B2
CN103221808B EP2646811A1 IN3705/CHENP/2013 JP5925798B | Method for Automatic Peak Finding in Calorimetric Data | MicroCal DSC Range |
OMNISEC
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9759644B2
US20180106710A1 | Balanced Capillary Bridge Viscometer | OMNISEC |
| US9612183B2
EP2619543B1 (GB, FR, DE602011011174) JP05916734B2 CN103168223B IN603MUMNP2013A | Modular Capillary Bridge Viscometer | OMNISEC |
Floor standing XRF
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| NL1028157C2 | A method for data transfer between an X-ray analysis system and a corresponding X-ray analysis linkable component. | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7516031B2
JP4950523B2 EP1701154B1 (FR, DE602005004506T2) | Apparatus and method for correcting for aberrations | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US8210000B2
JP5554163B2 CN101941789B EP2270410B1 (GB, FR, NL, DE602009003389) | Bead furnace | Zetium
Axios FAST Epsilon5 |
| US6823043B2 | Determination of material parameters
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7949092B2
| Device and method for performing X-ray analysis
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS |
| US6574305B2
JP3989836B2 EP1336096B1 (GB, FR, NL, DE60136089D1) | Device and method for the inspection of the condition of a sample | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| JP4111336B2 | Device for testing the sample with X-ray
| Epsilon5
|
| US7042978B2 | Examination of material samples | Zetium*
Axios FAST* Epsilon5 SEMYOS* |
| JP4406559B2
EP1434983B1 (CH+LI, GB, FR, NL, DE60240560) | Limiting device for electromagnetic radiation, notably in an analysis device | Zetium*
Epsilon5 |
| JP5782451B2
CN102792222A EP2510397B1 (GB, FR, NL, DE602010021859) | Method for manufacturing a multilayer structure with a lateral pattern for application in the xuv wavelength range, and bf and Imag structures manufactured according to this method | Zetium*
Axios FAST 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US9658352B2
CN104833557A JP656263B2 | Method of making a standard | Zetium
Axios FAST |
| CN105308443A
EP2787342B1 (GB, FR, NL, DE602013028642) JP6360151B2 | Preparation of sample-pellets by pressing | Zetium
Axios FAST |
| US10107551B2
EP2966039B1 (GB, FR, NL, DE602014024004) JP6559486B2 | Preparation of samples for XRF using flux and platinum crucible | Zetium
Axios FAST |
| US9784699B2
JP2016161577A CN105937890B EP3064931A1 | Quantitative X-ray Analysis - Matrix thickness correction | Zetium*
Axios FAST |
| US9739730B2
JP2016161578A CN105938113A EP3064933A1 | Quantitative X-ray Analysis - Multi optical path instrument | Zetium*
Axios FAST |
| US9851313B2
JP2016176931A CN105938112A EP3064932A1 | Quantitative X-ray Analysis - Ratio correction | Zetium*
Axios FAST |
| JP3936912B2 | Sample container with floating cover for x-ray analysis of liquids | Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US9239305B2 | Sample holder | Zetium*
Axios FAST* Epsilon5 |
| US7978820B2
CN102128845B EP2315009B1 (CH+LI, GB, FR, NL, DE602010043528) | X-ray diffraction and fluorescence | Zetium
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7720192B2
JP5574575B2 CN101311708B | X-ray fluorescence apparatus | Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US7194067B2
JP4315798B2 EP1393327B1 (GB, FR, NL, DE60237442D1) | X-ray optical system | Zetium
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5* SEMYOS* |
| US8223923B2
JP5266310B2 CN101720491B EP1983547B1 (GB, FR, NL, DE602008000361D1) | X-ray source with metal wire cathode | Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US9911569B2
JP2016131150A CN105810541B EP3043371B2 (GB, FR, NL, DE602015012421) | X-ray Tube Anode Arrangement
| Zetium
Axios FAST 2830 ZT (wafer analyser) Epsilon5 SEMYOS |
| US6385295B1
JP3746191B2 DE10056623B4 | X-ray tube provided with a rare earth anode
| Zetium*
Axios FAST* 2830 ZT (wafer analyser)* Epsilon5 SEMYOS* |
| *· Optional / not standard in product | ||
Benchtops XRF
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| NL1028157C2 | A method for data transfer between an X-ray analysis system and a corresponding X-ray analysis linkable component. | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7516031B2
JP4950523B2 EP1701154B1 (FR, NL, DE602005004506T2) | Apparatus and method for correcting for aberrations | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US8210000B2
JP5554163B2 CN101941789B EP2270410B1 (GB, FR, NL, DE602009003389) | Bead furnace | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US6823043B2 | Determination of material parameters
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7949092B2
| Device and method for performing X-ray analysis
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US6574305B2
JP3989836B2 EP1336096B1 (GB, FR, NL, DE60136089D1) | Device and method for the inspection of the condition of a sample | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7042978B2 | Examination of material samples | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| JP4406559B2
EP1434983B1 (CH+LI, FR, GB, NL, DE60240560) | Limiting device for electromagnetic radiation, notably in an analysis device | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9658352B2
CN104833557A JP6562635B2 | Method of making a standard | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| CN105308443A
EP2787342B1 (GB, FR, NL, DE602013028642) JP6360151B2 | Preparation of sample-pellets by pressing | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US10107551B2
JP6559486B2 CN105258987A EP2966039B1 (GB, FR, NL, DE602014024004) | Preparation of samples for XRF using flux and platinum crucible | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US9784699B2
JP2016161577A CN105937890B EP3064931A1 | Quantitative X-ray Analysis - Matrix thickness correction | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9739730B2
JP2016161578A CN105938113A EP3064933A1 | Quantitative X-ray Analysis - Multi optical path instrument | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9851313B2
JP2016176931A CN105938112A EP3064932A1 | Quantitative X-ray Analysis - Ratio correction | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| JP3936912B2 | Sample container with floating cover for x-ray analysis of liquids | Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US9239305B2 | Sample holder | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9547094B2
CN104849295B EP2908127B1 (CH+LI, GB, FR, NL, DE602014011398) JP6526983B2 | X-ray analysis apparatus
| Epsilon 1 range
Epsilon 3X spectrometers Epsilon 4 Air Quality edition |
| US7978820B2
CN102128845B EP2315009B1 (CH+LI, GB, FR, NL, DE602010043528) | X-ray diffraction and fluorescence | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US7194067B2
JP4315798B2 EP1393327B1 (GB, FR, NL, DE60237442D1) | X-ray optical system | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US8223923B2
JP5266310B2 CN101720491B EP1983547B1 (GB, FR, NL, DE602008000361D1) | X-ray source with metal wire cathode | Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US9911569B2
JP2016131150A CN105810541B EP3043371B2 (GB, FR, NL, DE602015012421) | X-ray Tube Anode Arrangement
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| US6385295B1
JP3746191B2 DE10056623B4 | X-ray tube provided with a rare earth anode
| Epsilon 1 range*
Epsilon 3X spectrometers* Epsilon 4 Air Quality edition* |
| * Optional / not standard in product | ||
Floor standing XRD
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| NL1028157C2 | A method for data transfer between an X-ray analysis system and a corresponding X-ray analysis linkable component. | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US6815684B2
JP2002250705A DE10153978B4 | Analytical X-ray apparatus provided with a solid state position sensitive X-ray detector | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US7516031B2
JP4950523B2 EP1701154B1 (FR, DE602005004506T2) | Apparatus and method for correcting for aberrations | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US6444993B1
JP4925500B2 DE10035917B4 JP5127976B2 | Apparatus for radiation analysis with a variable collimator | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US6823043B2 | Determination of material parameters
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US6574305B2
JP3989836B2 EP1336096B1 (GB, FR, NL, DE60136089D1) | Device and method for the inspection of the condition of a sample | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US9506880B2
CN104251870B EP2818851A1 JP6403452B2 | Diffraction imaging | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7116754B2 | Diffractometer | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US8488740B2
JP6009156B2 CN102565108B EP2455747B1 (GB, FR, NL, DE602011022779) | Diffractometer
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7858945B2
JP5254066B2 CN101521246B EP2088451B1 (GB, FR, NL, DE602008041760) | Imaging Detector | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7538328B1
EP2088625B1 (GB, FR, NL, DE602009040563) | Imaging detector | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US6370490B1
JP4633311B2 EP1105814B1 (GB, FR, DE60037235T2) | Method of determining an intrinsic spectrum from a measured spectrum
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US9110003B2
CN103383363B EP2634566B1 (GB, FR, NL, DE602012058202) JP6198406B2 | Microdiffraction
| Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US6704390B2
JP4868660B2 DE10125454B4 | X-ray analysis apparatus provided with a multilayer mirror and an exit collimator | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US9640292B2
CN104777179B EP2896960B1 (GB, FR, NL, DE602014012155) JP6564683B2 | X-ray apparatus
| Empyrean
X'Pert³ Powder CubiX³ range |
| US7756248B2
JP5145263B2 CN101545873B EP2090883B1 (GB, FR, NL, DE602008002143D1) | X-ray detection in packaging
| Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) |
| US8477904B2
JP5752434B2 CN102253065B EP2365319B1 (GB, FR, NL, DE602011055847) | X-ray diffraction and computed tomography | Empyrean
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7242743B2
JP3968350B2 EP1495311B1 (GB, FR, NL, DE60343064) | X-ray diffraction apparatus and method
| X'Pert³ MRD (XL)*
|
| US7542547B2
JP5280057B2 CN101256160B EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351) | X-ray diffraction equipment for X-ray scattering
| X'Pert³ Powder*
X'Pert³ MRD (XL)* |
| EP1287342B1 (GB, FR, DE60147121) | X-ray diffractometer | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US7477724B2
EP1703276B1 (GB, FR, NL, DE602005033962) | X-ray instrument | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range |
| US7194067B2
JP4315798B2 EP1393327B1 (GB, FR, NL, DE60237442D1) | X-ray optical system | Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US8437451B2
JP5999901B2 CN102610290B EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906) | X-ray shutter arrangement | Empyrean
X'Pert³ Powder X'Pert³ MRD (XL) CubiX³ range |
| US9911569B2
JP2016131150A CN105810541B EP3043371B1 (GB, FR, NL, DE602015012421 | X-ray Tube Anode Arrangement
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| US6385295B1
JP3746191B2 DE10056623B4 | X-ray tube provided with a rare earth anode
| Empyrean*
X'Pert³ Powder* X'Pert³ MRD (XL)* CubiX³ range* |
| * Optional / not standard in product | ||
QualitySpec 7000
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US8164747B2
CA2667650C EP2092296B1 (CH+LI, NL, SE, DK, DE602007045593) | Apparatus, system and method for optical spectroscopic measurements | QualitySpec 7000 |
TerraSpec Halo
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9207118B2 | Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation | TerraSpec Halo |
QualitySpec Trek
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| US9207118B2 | Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation | QualitySpec Trek |
Benchtops XRD
| Patent Numbers | Patent Title | Instruments |
|---|---|---|
| NL1028157C2 | A method for data transfer between an X-ray analysis system and a corresponding X-ray analysis linkable component. | Aeris*
|
| US6815684B2
DE10153978B4 | Analytical X-ray apparatus provided with a solid state position sensitive X-ray detector | Aeris*
|
| US7516031B2
JP4950523B2 EP1701154B1 (FR, DE602005004506T2) | Apparatus and method for correcting for aberrations | Aeris
|
| US6444993B1
JP4925500B2 DE10035917B4 JP5127976B2 | Apparatus for radiation analysis with a variable collimator | Aeris*
|
| US6823043B2 | Determination of material parameters
| Aeris*
|
| US9506880B2
CN104251870B EP2818851A1 JP6403452B2 | Diffraction imaging | Aeris*
|
| US7116754B2 | Diffractometer | Aeris*
|
| US8488740B2
JP6009156B2 CN102565108B EP2455747B1 (GB, FR, NL, DE602011022779) | Diffractometer | Aeris* |
| US7858945B2
JP5254066B2 CN101521246B EP2088451B1 (GB, FR, NL, DE602008041760) | Imaging Detector | Aeris* |
| US7538328B1
EP2088625B1 (CH+LI, GB, FR, NL, DE602009040563) | Imaging detector | Aeris*
|
| US6370490B1
JP4633311B2 EP1105814B1 (GB, FR, DE60037235T2) | Method of determining an intrinsic spectrum from a measured spectrum
| Aeris*
|
| US6704390B2
JP4868660B2 DE10125454B4 | X-ray analysis apparatus provided with a multilayer mirror and an exit collimator | Aeris* |
| US9640292B2
JP6564572B2 CN104777179B EP2896960B1 (GB, FR, NL, DE602014012155) | X-ray apparatus | Aeris |
| US8477904B2
JP5752434B2 CN102253065B EP2365319B1 (GB, FR, NL, DE602011055847) | X-ray diffraction and computed tomography | Aeris*
|
| US7542547B2
JP5280057B2 CN101256160B EP1947448B1 (CH+LI, GB, FR, NL, DE602007031351) | X-ray diffraction equipment for X-ray scattering
| Aeris*
|
| EP1287342B1 (GB, FR, DE60147121) | X-ray diffractometer | Aeris*
|
| US7477724B2
EP1703276B1 (GB, FR, NL, DE602005033962) | X-ray instrument | Aeris*
|
| US7194067B2
JP4315798B2 EP1393327B1 (GB, FR, NL, DE60237442D1) | X-ray optical system | Aeris*
|
| US8437451B2
JP5999901B2 CN102610290B EP2477191B1 (CH+LI, GB, FR, NL, DE602011035906) | X-ray shutter arrangement | Aeris
|
| US9911569B2
JP2016131150A CN105810541B EP3043371B1 (GB, FR, NL, DE602015012421) | X-ray Tube Anode Arrangement
| Aeris*
|
| US6385295B1
JP3746191B2 DE10056623B4 | X-ray tube provided with a rare earth anode
| Aeris*
|
* Optional / not standard in product | ||