Interface roughness

X-ray scattering  offers a non-destructive method of gaining information of buried interfaces.  X-ray reflectometry  is sensitive to film thickness, density of the materials, and to interfacial roughness. However, from specular reflection alone it is not possible to distinguish density gradient from physical roughness. The diffuse incoherent part from a rough surface/interface can be best measured by X-ray off-specular scattering. In one of the possible scans the sample is rotating at a fixed detector angle.

The diffuse scattering data reveal the typical features of roughness. These wings (so-called Yoneda peaks) at the lower and higher side of the specular part indicate the presence of roughness. The range from the wings to the specular part is affected by the scattering length density. The analysis is carried out by fitting a sample model describing the rough interfaces in the distorted-wave Born approximation.

Image 1: Diffuse scattering data reveals typical features of roughness. Yoneda peaks indicate the presence of roughness.

Image 2: Frame-based 1D measurement of an iridium layer collected on Aeris.